Towards in-process x-ray CT for dimensional metrology
Open Access
- 19 January 2016
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 27 (3) , 035401
Abstract
No abstract availableKeywords
Funding Information
- Engineering and Physical Sciences Research Council (EP/K031066/1, EP/M010619/1)
This publication has 26 references indexed in Scilit:
- Industrial applications of computed tomographyCIRP Annals, 2014
- Quantitative X-ray tomographyInternational Materials Reviews, 2014
- Computed Tomography as a Tool for Tolerance Verification of Industrial PartsProcedia CIRP, 2013
- Physical characterization and performance evaluation of an x-ray micro-computed tomography system for dimensional metrology applicationsMeasurement Science and Technology, 2012
- Computed tomography for dimensional metrologyCIRP Annals, 2011
- Precise 3D dimensional metrology using high-resolution x-ray computed tomography (μCT)2010
- Achieving Traceability of Industrial Computed TomographyKey Engineering Materials, 2010
- Testing of x-ray microtomography systems using a traceable geometrical standardMeasurement Science and Technology, 2009
- Enhancement and Proof of Accuracy of Industrial Computed Tomography (CT) MeasurementsCIRP Annals, 2007
- CT-assisted metrology for manufacturing applications1996