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Carrier Density Evaluation in P-Type SiC by Raman Scattering
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Carrier Density Evaluation in P-Type SiC by Raman Scattering
Carrier Density Evaluation in P-Type SiC by Raman Scattering
Authors:
HH
Hiroshi Harima
Hiroshi Harima
TH
Toru Hosoda
Toru Hosoda
SN
Shinichi Nakashima
Shinichi Nakashima
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10 May 2000
journal article
Published by
Trans Tech Publications, Ltd.
in
Materials Science Forum
Vol. 338-342
,
607-610
DOI:
10.4028/www.scientific.net/msf.338-342.607
Abstract
No abstract available
Keywords
COUPLED MODE
FANO INTERFERENCE
HOLE CONCENTRATION
LO PHONON
PLASMON
P-TYPE SIC
RAMAN SCATTERING
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Cited by 34 articles
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