Ab initio modeling of boron clustering in silicon
- 25 September 2000
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 77 (13) , 2018-2020
Abstract
We present results of ab initio calculations for the structure and energetics of boron-interstitial clusters in Si and a respective continuum model for the nucleation, growth, and dissolution of such clusters. The structure of the clusters and their possible relationship to boron precipitates and interstitial-cluster formation are discussed. We find that neither the local-density approximation nor the generalized-gradient approximation to the density-functional theory result in energetics that predict annealing and activation experiments perfectly well. However, gentle refitting of the numbers results in a model with good predictive qualities.Keywords
This publication has 26 references indexed in Scilit:
- Stability of Si-Interstitial Defects: From Point to Extended DefectsPhysical Review Letters, 2000
- Mechanism of Boron Diffusion in Silicon: AnAb Initioand Kinetic Monte Carlo StudyPhysical Review Letters, 1999
- Ab-Initio Pseudopotential Calculations of Boron Diffusion in SiliconMRS Proceedings, 1999
- On the Influence of Boron-Interstitial Complexes on Transient Enhanced DiffusionMRS Proceedings, 1999
- 3D Atomistic Simulations of Submicron Device FabricationMRS Proceedings, 1997
- Ab initiopseudopotential calculations of B diffusion and pairing in SiPhysical Review B, 1996
- Expanded-volume phases of silicon: Zeolites without oxygenPhysical Review B, 1996
- Ab initiomolecular-dynamics simulation of the liquid-metal–amorphous-semiconductor transition in germaniumPhysical Review B, 1994
- Hole Generation without Annealing in High Dose Boron Implanted Silicon: Heavy Doping by B12 Icosahedron as a Double AcceptorJapanese Journal of Applied Physics, 1994
- Theory of two boron neutral pair defects in siliconJournal of Physics: Condensed Matter, 1992