Silicon lattice constant: limits in IMGC X-ray/optical interferometry
Authors:
- A. BergaminABA. Bergamin
- G. CavagneroGCG. Cavagnero
- G. ManaGMG. Mana
- E. VittoneE. Vittone
- G. ZosiGZG. Zosi
- 1 April 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 40 (2) , 98-102
Abstract
No abstract availableKeywords
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