Methods of terahertz-subterahertz BWO spectroscopy of conducting materials

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Abstract
This paper considers present spectroscopic methods developed for measurement of dielectric response (conductivity and permittivity spectra) of condensed media in the terahertz-subterahertz spectral regions. The techniques based on the use of BWO spectrometers and designed for direct quantitative measurements (without invoking the Kramers-Kronig relations) in the terahertz-subterahertz frequency range (0.03–1.45 THz) of the conductivity σ(ν) and permittivity ɛ′(ν) spectra of conducting and absorbing materials are described. The techniques are based on measuring the amplitude and phase of the transmission coefficient of film samples on dielectric substrates and the reflection coefficient of a reference plane-parallel dielectric plate contacting the surface of the sample under study. The use of these techniques in measurement of the σ(ν)) and ɛ′(ν) spectra of conductors and superconductors is illustrated with examples.

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