Few electrons injection in silicon nanocrystals probed by ultrahigh vacuum atomic force microscopy
Open Access
- 13 January 2005
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 86 (3) , 033109
Abstract
Ultrahigh vacuum atomic force microscopy has been used to inject and detect charges in individual silicon nanocrystals. The sensitivity of our measurements is shown to be better than . Injected charge saturates as a function of injection time for a given electric field. The potential of the charged nanocrystal as a function of the number of charges in the dot is in good agreement with a simple electrostatic model.
Keywords
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