Structural, electrical, and mechanical properties of nc-TiC∕a-SiC nanocomposite thin films
- 1 November 2005
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
- Vol. 23 (6) , 2486-2495
Abstract
We have synthesized Ti–Si–C nanocomposite thin films by dc magnetron sputtering from a compound target in an Ar discharge on Si(100), , and Al substrates at temperatures from room temperature to . Electron microscopy, x-ray diffraction, and x-ray photoelectron spectroscopy showed that the films consisted of nanocrystalline TiC and amorphous SiC, with the possible presence of a small amount of noncarbidic C. The growth mode was columnar, yielding a nodular film-surface morphology. Mechanically, the films exhibited a remarkable ductile behavior. Their nanoindentation hardness and E-modulus values were 20 and , respectively. The electrical resistivity was for optimal Ar pressure and substrate temperature . The resulting films performed well as electrical contact material. These films’ electrical-contact resistance against Ag was remarkably low, at a contact force of compared to for Ag against Ag. The chemical stability of the films was excellent, as shown by a Battelle flowing mixed corrosive-gas test, with no N, Cl, or S contaminants entering the bulk of the films.
Keywords
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