Three-dimensional analysis of the local structure of Cu on TiO2(110) by in situ polarization-dependent total-reflection fluorescence XAFS

Authors:
  • WCWang-Jae Chun
    Wang-Jae Chun
  • TSTakafumi Shido
    Takafumi Shido
  • KAKiyotaka Asakura
    Kiyotaka Asakura
  • YIYasuhiro Iwasawa
    Yasuhiro Iwasawa
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Abstract
Cu K-edge XAFS of Cu/TiO2(110) was measured by polarization-dependent total-reflection fluorescence XAFS technique. XAFS of [001], [1\bar10] and [110] directions were measured to elucidate the three dimensional structure of Cu species on the TiO2(110) surface prepared by the deposition of Cu(DPM)2 followed by reduction with H2. Simulation of the EXAFS functions as well as conventional curve fitting analysis revealed that plane Cu3-4 small clusters with similar structure to Cu(111) plane were formed by the reduction at 363 K. The small clusters converted into spherical metallic Cu particles by the reduction at 473 K.