Effect of multiple reflows on interfacial reaction and shear strength of Sn–Ag electroplated solder bumps for flip chip package
Authors:
- Jin-Kyu JangJJJin-Kyu Jang
- Sang-Ok HaSHSang-Ok Ha
- Jeong-Won YoonJYJeong-Won Yoon
- Hoo-Jeong LeeHLHoo-Jeong Lee
- Jin-Ho JooJJJin-Ho Joo
- Young-Ho KimYKYoung-Ho Kim
- Seung-Boo JungSJSeung-Boo Jung
- 1 March 2010
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 87 (3) , 517-521
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Effect of displacement rate on ball shear properties for Sn–37Pb and Sn–3.5Ag BGA solder joints during isothermal agingMicroelectronics Reliability, 2007
- Investigations of the test parameters and bump structures in the shear test of flip chip solder bumpThin Solid Films, 2006
- High density of electrodeposited Sn/Ag bumps for flip chip connectionMicroelectronic Engineering, 2006
- Evaluation of displacement rate effect in shear test of Sn–3Ag–0.5Cu solder bump for flip chip applicationMicroelectronics Reliability, 2006
- A study in flip-chip UBM/bump reliability with effects of SnPb solder compositionMicroelectronics Reliability, 2006
- Solid state interfacial reaction and joint strength of Sn–37Pb solder with Ni–P under bump metallization in flip chip applicationJournal of Alloys and Compounds, 2005
- Interfacial reactions between lead-free solders and common base materialsMaterials Science and Engineering: R: Reports, 2005
- Experimental and finite element analysis of the shear speed effects on the Sn–Ag and Sn–Ag–Cu BGA solder jointsMaterials Science and Engineering: A, 2004
- CrCu based UBM (under bump metallization) study with electroplated Pb/63Sn solder bumps - interfacial reaction and bump shear strengthIEEE Transactions on Components and Packaging Technologies, 2003
- Tin–lead (SnPb) solder reaction in flip chip technologyMaterials Science and Engineering: R: Reports, 2001