Effect of Ti/Si and Ti/TiN/Si interlayers on the structure, properties, and tribological behavior of an a-C film deposited onto a C17200 copper-beryllium alloy

Authors:
  • SASantos
    Santos
  • NFN.K. Fukumasu
    N.K. Fukumasu
  • ATA.P. Tschiptschin
    A.P. Tschiptschin
  • NLN.B. Lima
    N.B. Lima
  • CFC.A. Figueroa
    C.A. Figueroa
  • JWJ.S. Weber
    J.S. Weber
  • RSR.M. Souza
    R.M. Souza
  • IMI.F. Machado
    I.F. Machado

Abstract
No abstract available

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