The naval research laboratory materials analysis beam line at the national synchrotron light source
Authors:
- J.P. KirklandJKJ.P. Kirkland
- D.J. NagelDND.J. Nagel
- P.L. CowanPCP.L. Cowan
- 15 April 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 208 (1-3) , 49-54
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- A grating/crystal monochromator for the spectral range 5 eV to 5 keVNuclear Instruments and Methods in Physics Research, 1982
- Layered Synthetic Microstructures as Dispersing Devices in X-ray SpectrometersApplied Spectroscopy, 1982
- X-ray monochromator system for use with synchrotron radiation sourcesReview of Scientific Instruments, 1981
- Structure of the hydrophobic protein crambin determined directly from the anomalous scattering of sulphurNature, 1981
- X-ray sensitivity of a charge-coupled-device arrayJournal of Applied Physics, 1977
- Sensitivity of x-ray films. I. A model for sensitivity in the 1–100-keV regionJournal of Applied Physics, 1976
- Integral Reflection Coefficient of X-ray Spectrometer CrystalsApplied Spectroscopy, 1975
- General Ray-Tracing Procedure†Journal of the Optical Society of America, 1962