Direct measurement of critical resolved shear stress of prismatic and basal slip in polycrystalline Ti using high energy X-ray diffraction microscopy
Authors:
- L. WangLWL. Wang
- Z. ZhengZZZ. Zheng
- H. PhukanHPH. Phukan
- P. KeneseiPKP. Kenesei
- J.-S. ParkJPJ.-S. Park
- J. LindJLJ. Lind
- R.M. SuterRSR.M. Suter
- T.R. BielerTBT.R. Bieler
Top Cited Papers
- 1 June 2017
- journal article
- Published by Elsevier in Acta Materialia
- Vol. 132, 598-610
Abstract
No abstract availableFunding Information
- NSF Materials World Network (NSF-DMR-1108211, DMR-0710570)
- U.S. Department of Energy (DESC0002001)
- United States Department of Energy
- Office of Science
- Office of Basic Energy Sciences (DE-AC02-06CH11357)
- National Natural Sciences Foundation of China (51671127)
- Lawrence Livermore National Laboratory (DE-AC52-07NA27344)
- X-Ray Science Division, Argonne National Laboratory
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