Direct measurement of critical resolved shear stress of prismatic and basal slip in polycrystalline Ti using high energy X-ray diffraction microscopy

Authors:
  • LWL. Wang
    L. Wang
  • ZZZ. Zheng
    Z. Zheng
  • HPH. Phukan
    H. Phukan
  • PKP. Kenesei
    P. Kenesei
  • JPJ.-S. Park
    J.-S. Park
  • JLJ. Lind
    J. Lind
  • RSR.M. Suter
    R.M. Suter
  • TBT.R. Bieler
    T.R. Bieler

Abstract
No abstract available
Funding Information
  • NSF Materials World Network (NSF-DMR-1108211, DMR-0710570)
  • U.S. Department of Energy (DESC0002001)
  • United States Department of Energy
  • Office of Science
  • Office of Basic Energy Sciences (DE-AC02-06CH11357)
  • National Natural Sciences Foundation of China (51671127)
  • Lawrence Livermore National Laboratory (DE-AC52-07NA27344)
  • X-Ray Science Division, Argonne National Laboratory

This publication has 44 references indexed in Scilit: