AI-enabled defect detection in industrial products: A comprehensive survey, key insights and future research challenges
Authors:
- Lutfun NaharLNLutfun Nahar
- Mohammad AwrangjebMAMohammad Awrangjeb
- Saiful IslamSISaiful Islam
Open Access
- 20 November 2025
- journal article
- Published by Elsevier in Advanced Engineering Informatics
- Vol. 69
Abstract
No abstract availableThis publication has 189 references indexed in Scilit:
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