Degradation of carrier lifetime in silicon crystals at room temperature
Authors:
- 16 September 1978
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 49 (1) , 137-144
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Carrier lifetime measurements on electron-irradiated silicon crystalsPhysica Status Solidi (a), 1975
- Gettering rates of various fast-diffusing metal impurities at ion-damaged layers on siliconApplied Physics Letters, 1972
- The Effect of HCl and Cl[sub 2] on the Thermal Oxidation of SiliconJournal of the Electrochemical Society, 1972
- Gold as a recombination centre in siliconSolid-State Electronics, 1965
- Metal Precipitates in Silicon p-n JunctionsJournal of Applied Physics, 1960