Capillary forces in tapping mode atomic force microscopy
Authors:
- 31 October 2002
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 66 (15) , 155436
Abstract
We investigated the influence of the relative humidity on amplitude and phase of the cantilever oscillation while operating an atomic force microscope (AFM) in the tapping mode. If the free oscillation amplitude exceeds a certain critical amplitude the amplitude- and phase-distance curves show a transition from a regime with a net attractive force between tip and sample to a net repulsive regime. For hydrophilic tip and sample this critical amplitude is found to increase with increasing relative humidity. In contrast, no such dependence was found for hydrophobic samples. Numerical simulations show that this behavior can be explained by assuming the intermittent formation and rupture of a capillary neck in each oscillation cycle of the AFM cantilever.
Keywords
This publication has 38 references indexed in Scilit:
- SURFACE BIOLOGY OF DNA BY ATOMIC FORCE MICROSCOPYAnnual Review of Physical Chemistry, 2001
- Tapping Mode Atomic Force Microscopy on Polymers: Where Is the True Sample Surface?Macromolecules, 2001
- Investigation of micro-adhesion by atomic force microscopyApplied Surface Science, 2001
- Quantitative Measurement of the Mechanical Contribution to Tapping-Mode Atomic Force Microscopy Images of Soft MaterialsLangmuir, 2000
- NanotomographyPhysical Review Letters, 2000
- Optimizing phase imaging via dynamic force curvesSurface Science, 2000
- Imaging Liquid Structures on Inhomogeneous Surfaces by Scanning Force MicroscopyLangmuir, 1998
- Factors Affecting the Height and Phase Images in Tapping Mode Atomic Force Microscopy. Study of Phase-Separated Polymer Blends of Poly(ethene-co-styrene) and Poly(2,6-dimethyl-1,4-phenylene oxide)Langmuir, 1997
- Imaging material properties by resonant tapping-force microscopy: A model investigationPhysical Review B, 1996
- Forces affecting the substrate in resonant tapping force microscopyNanotechnology, 1995