Evolutionary determination of experimental parameters for ptychographical imaging
- 15 June 2011
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 109 (12) , 124510
Abstract
The Ptychographical Iterative Engine (PIE) algorithm is a recently developed novel method of Coherent Diffractive Imaging (CDI) that uses multiple overlapping diffraction patterns to reconstruct an image. This method has successfully produced high quality reconstructions at both optical and X-ray wavelengths but the need for accurate knowledge of the probe positions is currently a limiting factor in the production of high resolution reconstructions at electron wavelengths. This paper examines the shape of the search landscape for producing optimal image reconstructions in the specific case of electron microscopy and then shows how evolutionary search methods can be used to reliably determine experimental parameters in the electron microscopy case (such as the spherical aberration in the probe and the probe positions).Keywords
This publication has 24 references indexed in Scilit:
- Atomic-Resolution Imaging with a Sub-50-pm Electron ProbePhysical Review Letters, 2009
- Measurement of coherent x-ray focused beams by phase retrieval with transverse translation diversityOptics Express, 2009
- High-Resolution Scanning X-ray Diffraction MicroscopyScience, 2008
- Hard-X-Ray Lensless Imaging of Extended ObjectsPhysical Review Letters, 2007
- Movable Aperture Lensless Transmission Microscopy: A Novel Phase Retrieval AlgorithmPhysical Review Letters, 2004
- A note on representations and variation operatorsIEEE Transactions on Evolutionary Computation, 1997
- The theory of super-resolution electron microscopy via Wigner-distribution deconvolutionPhilosophical Transactions A, 1992
- Beugung im inhomogenen Primärstrahlwellenfeld. III. Amplituden- und Phasenbestimmung bei unperiodischen ObjektenActa Crystallographica Section A, 1969
- Beugung im inhomogenen Primärstrahlwellenfeld. I. Prinzip einer Phasenmessung von ElektronenbeungungsinterferenzenActa Crystallographica Section A, 1969
- Beugung in inhomogenen Primärstrahlenwellenfeld. II. Lichtoptische Analogieversuche zur Phasenmessung von GitterinterferenzenActa Crystallographica Section A, 1969