SEU-Induced Bitflips of 7-Series FPGA Under Fast Neutron Irradiation
Open Access
- 1 August 2026
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 73 (8) , 3396-3404
Abstract
No abstract availableFunding Information
- U.S. Nuclear Regulatory Commission (NRC-31310024M0011)
- U.S. Department of Energy/National Nuclear Security Administration (DENA0003921)
This publication has 35 references indexed in Scilit:
- Review of research and capabilities of 500 kW research reactor at the Ohio State UniversityAnnals of Nuclear Energy, 2024
- Testing of an organic metal halide perovskite for fast neutron detectionNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2024
- Response of silicon solar cells to neutrons in post-detonation monitoringNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2024
- SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident anglesMicroprocessors and Microsystems, 2022
- Heavy ion-induced MCUs in 28 nm SRAM-based FPGAs: upset proportions, classifications, and pattern shapesNuclear Science and Techniques, 2022
- Quantifying spatial resolution in a fast neutron radiography systemNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2022
- Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plantsNuclear Engineering and Technology, 2017
- Estimating the SEU failure rate of designs implemented in FPGAs in presence of MCUsMicroelectronics Reliability, 2017
- Soft Error Rate and Fault Tolerance Techniques for FPGAs2014
- Application of FPGA to Nuclear Power Plant I&C Systems2014