Invited Review Article: A review of techniques for attaching micro- and nanoparticles to a probe’s tip for surface force and near-field optical measurements
Author:
- 1 August 2007
- journal article
- review article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 78 (8) , 081101
Abstract
Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.Keywords
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