Self-absorbed Al lines in laser-induced plasma

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Abstract
Self-reversed line profiles of Al 3s 23p → 3s2 4s transitions in a laser ablation plasma are considered following plasma initiation on the surface of an Al alloy target. Experimental self-absorption correction factors are tabulated by measuring plasma line profiles with and without its reflection using the mirror duplication method. At a delay of 60 ns, measured line profiles 0.5 mm from the Al surface show self-reversed line profiles. Corrected line widths are determined to be 1.1 ± 0.2 and 1.7 ± 0.2 nm for the 394.4 and 396.15 nm lines, respectively, following fitting with a Voigt line profile. N e are determined to be 3.8 ± 0.4 and 10 ± 1 × 1018 cm−3, respectively.