Mechanism of the lattice relaxation in thin epitaxial films of iron oxides: Generalization from the case of ilmenite–hematite solid solution
- 30 June 2011
- journal article
- research article
- Published by Elsevier in Surface Science
- Vol. 605 (11-12) , 1043-1047
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Dislocation network driven structural relaxation in hematite thin filmsMaterials Science and Engineering: B, 2007
- Electronic and crystalline structure, morphology, and magnetism of nanometriclayers deposited on Pt(111) by atomic-oxygen-assisted molecular beam epitaxyPhysical Review B, 2005
- Elastic effects on surface physicsSurface Science Reports, 2004
- The characteristics of interface misfit dislocations for epitaxial α-Fe2O3 on α-Al2O3(0001)Thin Solid Films, 2002
- Elastic relaxation during 2D epitaxial growth: a study of in-plane lattice spacing oscillationsSurface Science, 2001
- Structural properties of epitaxial nanometric iron oxide layers on α-Al2O3(0001): an in situ RHEED study during growthSurface Science, 2000
- Morphological and structural investigation of the early stages of epitaxial growth of α-Fe2O3 (0001) on α-Al2O3 (0001) by oxygen-plasma-assisted MBESurface Science, 1999
- Growth and structure of ultrathin FeO films on Pt(111) studied by STM and LEEDPhysical Review B, 1998
- In situ RHEED and XPS studies of epitaxial thin α-Fe2O3(0001) films on sapphireSurface Science, 1996
- Surface strains and measurements of misfit dislocation density by diffraction methods in thin films on substratesThin Solid Films, 1994