The spatial phase-shifting measuring profilometry based on dual-frequency grating
Authors:
- Haihua AnHAHaihua An
- Yiping CaoYCYiping Cao
- Haitao WuHWHaitao Wu
- Hechen ZhangHZHechen Zhang
- Hongmei LiHLHongmei Li
- 1 August 2021
- journal article
- research article
- Published by Elsevier in Optics and Lasers in Engineering
- Vol. 143
Abstract
No abstract availableKeywords
Funding Information
- Sichuan University
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