Theoretical performance model for single image depth from defocus
Open Access
- 11 November 2014
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 31 (12) , 2650-2662
Abstract
In this paper we present a performance model for depth estimation using single image depth from defocus (SIDFD). Our model is based on an original expression of the Cramér–Rao bound (CRB) in this context. We show that this model is consistent with the expected behavior of SIDFD. We then study the influence on the performance of the optical parameters of a conventional camera such as the focal length, the aperture, and the position of the in-focus plane (IFP). We derive an approximate analytical expression of the CRB away from the IFP, and we propose an interpretation of the SIDFD performance in this domain. Finally, we illustrate the predictive capacity of our performance model on experimental data comparing several settings of a consumer camera.Keywords
This publication has 18 references indexed in Scilit:
- Passive depth estimation using chromatic aberration and a depth from defocus approachApplied Optics, 2013
- Role of optics in the accuracy of depth-from-defocus systems: commentJournal of the Optical Society of America A, 2007
- Image and depth from a conventional camera with a coded apertureACM Transactions on Graphics, 2007
- Dappled photographyACM Transactions on Graphics, 2007
- Multi-aperture photographyACM Transactions on Graphics, 2007
- Role of optics in the accuracy of depth-from-defocus systemsJournal of the Optical Society of America A, 2007
- A maximum-likelihood formalism for sub-resolution axial localization of fluorescent nanoparticlesOptics Express, 2005
- Depth from Defocus vs. Stereo: How Different Really Are They?International Journal of Computer Vision, 2000
- Performance Analysis of Maximum Likelihood Estimator for Recovery of Depth from Defocused Images and Optimal Selection of Camera ParametersInternational Journal of Computer Vision, 1998
- A New Sense for Depth of FieldIEEE Transactions on Pattern Analysis and Machine Intelligence, 1987