Intrinsic Electron-Phonon Resistivity ofin the Topological Regime
Open Access
- 15 October 2012
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 109 (16) , 166801
Abstract
We measure the temperature-dependent carrier density and resistivity of the topological surface state of thin exfoliated in the absence of bulk conduction. When the gate-tuned chemical potential is near or below the Dirac point, the carrier density is strongly temperature-dependent, reflecting thermal activation from the nearby bulk valence band, while, above the Dirac point, unipolar -type surface conduction is observed with negligible thermal activation of bulk carriers. In this regime, linear resistivity vs temperature reflects intrinsic electron-acoustic phonon scattering. A quantitative comparison with a theoretical transport calculation including both phonon and disorder effects gives the ratio of deformation potential to Fermi velocity . This strong phonon scattering in the surface state gives intrinsic limits for the conductivity and charge carrier mobility at room temperature of per surface and .
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Funding Information
- National Science Foundation
- Defense Advanced Research Projects Agency
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