The resolution of the low energy electron reflection microscope
Author:
- E. BauerEBE. Bauer
- 1 January 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 17 (1) , 51-56
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Investigation of ultra-thin Ag films on Ni with the photoelectron emission microscopeUltramicroscopy, 1985
- An analytical reflection and emission UHV surface electron microscopeUltramicroscopy, 1985
- Reflection electron microscopy (REM) of vicinal surfaces of fcc metalsUltramicroscopy, 1983
- Reflection electron microscopy (REM) of fcc metalsUltramicroscopy, 1983
- Reflection electron microscopy of clean and gold deposited (111) silicon surfacesSurface Science, 1980
- Oxygen on NickelJournal of Applied Physics, 1960
- Das Aufl sungsverm gen des Elektronenmikroskops f r SelbststrahlerThe European Physical Journal A, 1943
- Theorie des elektrischen Elektronenmikroskops für SelbststrahlerThe European Physical Journal A, 1941
- Die elektronenmikroskopische Abbildung elektronenbestrahlter Oberfl chenThe European Physical Journal A, 1933
- Elektronenoptik und ElektronenmikroskopThe Science of Nature, 1932