Degradation of YBCO Coated Conductors Due to an Over-Current Pulse
- 23 December 2010
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Applied Superconductivity
- Vol. 21 (3) , 3025-3028
Abstract
YBCO coated conductors are candidate materials for future electric power devices such as transmission cables, transformers, and fault current limiters. In practical applications, YBCO coated conductors are subject to short-circuit fault currents greater than the operating current. These fault currents cause heat generation, resulting in degradation of the characteristics of YBCO coated conductors. It is therefore necessary to identify the maximum temperatures under which YBCO coated conductors can operate without suffering degradation. To date, we have carried out preliminary experiments on the degradation of YBCO coated conductors due to an over-current pulse. We also focused on the relationship between increases in temperature and Ic degradation. In this study, we prepared YBCO coated conductors fabricated by TFA-MOD method. We also carried out over-current tests to investigate the Ic degradation and performed numerical simulations on thermal stress to estimate the stress and strain acting on the YBCO layer.Keywords
This publication has 7 references indexed in Scilit:
- Degradation Characteristics of YBCO-Coated Conductors Subjected to Overcurrent PulseIEEE Transactions on Applied Superconductivity, 2009
- Over-Current Characteristics of a 20-m-Long YBCO Model CableIEEE Transactions on Applied Superconductivity, 2009
- Fatigue tests of YBCO coated conductorsJournal of Physics: Conference Series, 2008
- Degradation of YBCO Coated Conductors Due to Over-Current PulseIEEE Transactions on Applied Superconductivity, 2007
- Large intrinsic effect of axial strain on the critical current of high-temperature superconductors for electric power applicationsApplied Physics Letters, 2007
- Stability and Quench Protection of Coated YBCO “Composite” TapeIEEE Transactions on Applied Superconductivity, 2005
- Over-Current Testing of HTS TapesIEEE Transactions on Applied Superconductivity, 2005