Photoelectron spectroscopy of the valence electronic structure of polymers

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Abstract
Photoelectron spectroscopy has been highly developed as an investigative tool of the bulk and surface chemical and electronic structure of condensed matter during the past 2 decades. The use of soft X-ray sources led to the development of electroq spectroscopy for chemical applications (ESCA),1,2 which is also known to the physicst as X-ray photoelectron spectroscopy (XPS). These developments were followed by the use of ultraviolet sources for the study of gases3 and the bulk and surface electronic structure of solids.4,5 Recently, the use of the continuous spectral distribution of synchrotron radiation has had a major impact upon the study of solid surfaces6,7 and has made the largely historical terminology of XPS (or ESCA) and ultraviolet photoelectron spectroscopy (UPS) somewhat less meaningful. Angle-resolved UPS and XPS (ARUPS and ARXPS) can provide additional information about electronic band structure, surface states, and adsorbates, but are typically applied to the study of the surfaces of ideal single crystals, where crystallographic high-symmetry directions as well as the polarization of the light source can be used to high advantage.7 Since polymers are almost never single crystals, the angle-resolved issue will not be addressed here.

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