Scanning electron microscopy of plant cuticles

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Abstract
Summary: The scanning electron microscope (SEM) has been used to examine the structure of a wide range of different plant cuticles. The extent to which wax deposits may be damaged by mechanical abrasion in the preparative stage and by the electron probe during the scanning processes has been investigated. Techniques have been developed for the examination of the constitution of complex wax deposits and in particular of their underlying structure. Methods of preparation of isolated cuticular membranes for study by scanning electron microscopy are described. The value of wet mounting for membranes which are subject to shrinkage during drying is discussed.