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1 April 1954
journal article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
in
Proceedings of the IRE
Vol. 42
(4)
,
760
DOI:
10.1109/JRPROC.1954.274709
Abstract
No abstract available
Keywords
SILICON
P-N JUNCTIONS
RECTIFIERS
TEMPERATURE
CONDUCTIVITY
SEMICONDUCTIVITY
BREAKDOWN VOLTAGE
CONTACTS
IMPURITIES
LIGHTNING
Cited
Cited by 7 articles
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