Direct measurements of the penetration depth in a superconducting film using magnetic force microscopy
- 28 December 2009
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 95 (26)
Abstract
We report the local measurements of the magnetic penetration depth λ in a superconducting Nb film using magnetic force microscopy (MFM). We developed a method for quantitative extraction of the penetration depth from single-parameter simultaneous fits to the lateral and height profiles of the MFM signal, and demonstrate that the obtained value is in excellent agreement with that obtained from the bulk magnetization measurements.Keywords
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