Bridging defects resistance measurements in a CMOS process
Authors:
- R. Rodriguez-MontanesRRR. Rodriguez-Montanes
- E.M.J.G. BruisEBE.M.J.G. Bruis
- J. FiguerasJFJ. Figueras
- 1 January 1992
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 892
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Detection and Location of Input and Feedback Bridging Faults Among Input and Output LinesIEEE Transactions on Computers, 1980
- Undetectability of Bridging Faults and Validity of Stuck-At Fault Test SetsIEEE Transactions on Computers, 1980