Thermal imaging and measurement techniques for electronic materials and devices
Authors:
- J. KölzerJKJ. Kölzer
- E. OesterschulzeEOE. Oesterschulze
- G. DeboyGDG. Deboy
- 1 February 1996
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 31 (1-4) , 251-270
Abstract
No abstract availableThis publication has 58 references indexed in Scilit:
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