Reconstruction of the S-matrix for a 3-port using measurements at only two ports
Author:
- M. DavidovitzMDM. Davidovitz
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Microwave and Guided Wave Letters
- Vol. 5 (10) , 349-350
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A triple-through method for characterizing test fixturesIEEE Transactions on Microwave Theory and Techniques, 1988