Low-Energy Electron Diffraction during Pulsed Laser Annealing: A Time- Resolved Surface Structural Study
Authors:
- 23 January 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 52 (4) , 307-310
Abstract
Nanosecond structural changes in a crystal lattice during pulsed laser annealing have been measured by use of time-resolved low-energy electron diffraction. Low-energy electron diffraction is both structure and surface (∼ 10 Å) sensitive and can yield lattice temperatures from Debye-Waller-like extinction coefficients. Combining these with nanosecond time resolution provides a surface probe for short-time dynamical processes. The results demonstrate rapid formation of a liquid layer and subsequent surface recrystallization and cooling on (111) Ge.Keywords
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