Quantitative characterization of the interfacial adhesion of Ni thin film on steel substrate: A compression-induced buckling delamination test
Authors:
- W. ZhuWZW. Zhu
- Y.C. ZhouYZY.C. Zhou
- J.W. GuoJGJ.W. Guo
- L. YangLYL. Yang
- C. LuCLC. Lu
- 1 January 2015
- journal article
- Published by Elsevier in Journal of the Mechanics and Physics of Solids
- Vol. 74, 19-37
Abstract
No abstract availableKeywords
Funding Information
- National Natural Science Foundation of China (11272275, 11002122, 51172192)
- Natural Science Foundation of Hunan Province (11JJ4003)
- Hunan Provincial Innovation Foundation for Postgraduate (CX2011B257)
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