Autoexposure for three-dimensional shape measurement using a digital-light-processing projector
Authors:
- 1 December 2011
- journal article
- Published by SPIE-Intl Soc Optical Eng in Optical Engineering
- Vol. 50 (12) , 123603-123603-7
Abstract
Automatically adapting the camera exposure time is crucial for industrial applications where minimum human intervention is usually desirable. However, it is very challenging to realize such a capability for a conventional fringe projection system where only a finite increment of the exposure time is allowed due to its digital fringe generation nature. We study the generation of sinusoidal fringe patterns by properly defocusing binary ones, which permits the use of an arbitrary exposure time. This provides the potential to adapt the exposure time automatically. We present the principle of an automatic exposure technique and show some experimental results.Keywords
This publication has 12 references indexed in Scilit:
- Ultrafast 3-D shape measurement with an off-the-shelf DLP projectorOptics Express, 2010
- Digital sinusoidal fringe pattern generation: Defocusing binary patterns VS focusing sinusoidal patternsOptics and Lasers in Engineering, 2010
- Analysis of measurement sensitivity to illuminance and fringe-pattern gray levels for fringe-pattern projection adaptive to ambient lightingOptics and Lasers in Engineering, 2010
- Flexible 3-D shape measurement using projector defocusingOptics Letters, 2009
- High dynamic range scanning techniqueOptical Engineering, 2009
- Optical Shop Testing2006
- Novel method for structured light system calibrationOptical Engineering, 2006
- On Applying a Minimization Technique to the Harmonic Elimination PWM Control: The Bipolar WaveformIEEE Power Electronics Letters, 2004
- Digital Light Processing for high-brightness high-resolution applications1997
- Automated phase-measuring profilometry using defocused projection of a Ronchi gratingOptics Communications, 1992