Effect of ion energy upon dielectric breakdown of the capacitor response in vertical power MOSFETs
Authors:
- J.L. TitusJTJ.L. Titus
- C.F. WheatleyCWC.F. Wheatley
- K.M. Van TyneKTK.M. Van Tyne
- J.F. KriegJKJ.F. Krieg
- D.I. BurtonDBD.I. Burton
- A.B. CampbellACA.B. Campbell
- 1 December 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 45 (6) , 2492-2499
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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