On detector linearity and precision of beam shift detection for quantitative differential phase contrast applications
- 1 September 2016
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 168, 53-64
Abstract
No abstract availableKeywords
Funding Information
- Deutsche Forschungsgemeinschaft (DFG FOR 957)
This publication has 35 references indexed in Scilit:
- Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled deviceApplied Physics Letters, 2012
- Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron MicroscopyMicroscopy and Microanalysis, 2012
- Reduction of internal polarization fields in InGaN quantum wells by InGaN/AlGaN ultra-thin superlattice barriers with different indium compositionJournal of Applied Physics, 2011
- Electron holography—basics and applicationsReports on Progress in Physics, 2007
- Nitride emitters go nonpolarPhysica Status Solidi (RRL) – Rapid Research Letters, 2007
- Observation of magnetic structures in Fe granular films by differential phase contrast scanning transmission electron microscopyJournal of Applied Physics, 2004
- Crystal orientation effects on electronic properties of wurtzite InGaN/GaN quantum wellsJournal of Applied Physics, 2002
- Quantitative imaging of magnetic domain walls in thin films using Lorentz and magnetic force microscopiesJournal of Applied Physics, 2001
- Modified differential phase contrast Lorentz microscopy for improved imaging of magnetic structuresIEEE Transactions on Magnetics, 1990
- The investigation of magnetic domain structures in thin foils by electron microscopyJournal of Physics D: Applied Physics, 1984