Rankings
Publications
Search Publications
Cited-by Search
Sources
Publishers
Scholars
Scholars
Top Cited Scholars
Organizations
About
Scilit
About Us
Advisory Board
Data Sources
Career
Support / Contact
User Guide
Publisher User
Search Function
Rankings Function
API Resource
Scilit Knowledge
Metrics
Scilit Recognitions
Publications Classification
Media
News
Blog
Login
Register
Home
Publications
Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies
Home
Publications
Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies
Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies
Authors:
JT
J.C. Tsang
J.C. Tsang
MF
M.V. Fischetti
M.V. Fischetti
Article Alert
Citation Alert
Add to Library
Cite
Download
Share
Download
Publisher website
Google Scholar
1 September 2001
journal article
Published by
Elsevier
in
Microelectronics Reliability
Vol. 41
(9)
,
1465-1470
DOI:
10.1016/s0026-2714(01)00194-9
Abstract
No abstract available
Keywords
CMOS TECHNOLOGIES
EMISSION BASED
TIMING PROBES
1V CMOS
BASED TIMING
HOT CARRIER EMISSION
Cited
Cited by 11 articles
Scroll to top