Quantifying the elastic deformation behavior of bridged nanobelts
- 14 August 2006
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 89 (7) , 073112
Abstract
A new approach for quantifying the elastic deformation behavior of one-dimensional nanostructures is presented by fitting the image profile measured using atomic force microscopy in contact mode along the entire length of a bridged/suspended nanobelt/nanowire/nanotube under different load forces. Consistently fitting the measured deformation profiles can uniquely determine if the measured data are best explained by either the clamped-clamped beam model or the free-free beam model without preassumption, and it eliminates the uncertainty in defining the central point of the suspended beam, thus, greatly increasing the precision and reliability of the measurements.Keywords
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