Open Set Industrial Surface Defect Recognition With High Frequency Feature Enhancement and Class Mutual-Information Constraint
- 16 January 2026
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Multimedia
- Vol. 28 (15209210) , 3755-3767
Abstract
Defect detection in multimedia data plays a pivotal role in industrial manufacturing. However, existing methods are primarily designed for closed-world scenarios and can only identify defect classes in the training data, limiting their ability to effectively detect unknown class defects that arise during production. To address this critical limitation, we propose a novel approach by introducing industrial defect open set recognition (IDOSR), which overcomes the challenge of recognizing unknown defect classes. Furthermore, to tackle the issues of limited training samples and subtle inter-class differences in IDOSR, we present a high-frequency feature enhancement open set recognition (HFFE-OSR) method. Specifically, HFFE-OSR employs a high-frequency structural feature fusion enhancement strategy to meticulously extract and fuse defect-related high-frequency structural features. This enables the network to comprehensively learn defect target representations even under limited training samples, resulting in robust feature extraction for known classes, thereby improving the discriminability between known and unknown classes and addressing the difficulty of distinguishing between them. Additionally, a class mutual information constraint strategy is introduced to measure and reduce the mutual information among defect features from different classes. This ensures the independence of defect features across known classes, further enhancing their discriminability and significantly improving recognition performance for known classes. Extensive experiments demonstrate that the proposed method significantly outperforms state-of-the-art OSR methods on ID-OSD and MVTec datasets, achieving improvements of at least 7% in accuracy (ACC), 22% in F1 score, and 10% in AUROC, highlighting the effectiveness of our approach in industrial defect detection.Keywords
Funding Information
- National Natural Science Foundation of China (U22B2014)
- National Natural Science Foundation of China (62101072)
- Science and Technology Plan Project Fund of Hunan Province (2022RSC3064)
- Key Project of Hunan Provincial Natural Science Foundation (2025JJ30027)
- National Natural Science Foundation of China (625B2066)
- National Natural Science Foundation of China (62501234)
This publication has 48 references indexed in Scilit:
- Generalized Out-of-Distribution Detection: A SurveyInternational Journal of Computer Vision, 2024
- Open Set Recognition in Real WorldInternational Journal of Computer Vision, 2024
- DSR – A Dual Subspace Re-Projection Network for Surface Anomaly Detection2022
- Difficulty-Aware Simulator for Open Set Recognition2022
- Gaussian-IoU loss: Better learning for bounding box regression on PCB component detectionExpert Systems with Applications, 2022
- PaDiM: A Patch Distribution Modeling Framework for Anomaly Detection and Localization2021
- Learning Open Set Network with Discriminative Reciprocal Points2020
- Hybrid Models for Open Set Recognition2020
- GANomaly: Semi-supervised Anomaly Detection via Adversarial Training2019
- Open Set Learning with Counterfactual Images2018