Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness
Authors:
- Yifang CaoYCYifang Cao
- Seyed AllamehSASeyed Allameh
- Derek NankivilDNDerek Nankivil
- Steve SethiarajSSSteve Sethiaraj
- Tom OtitiTOTom Otiti
- Wole SoboyejoWSWole Soboyejo
- 1 July 2006
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 427 (1-2) , 232-240
Abstract
No abstract availableKeywords
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