Improving the structural reliability of multilayered transition metal dichalcogenide electronics via stretching engineering
Authors:
- Nathan Samuel ShultzmanNSNathan Samuel Shultzman
- Guy AlboteanuGAGuy Alboteanu
- Nitzan CohenNCNitzan Cohen
- Assaf Ya'AKobovitzAYAssaf Ya'AKobovitz
- 10 June 2025
- journal article
- Published by Elsevier in Materials Science in Semiconductor Processing
- Vol. 198
Abstract
No abstract availableFunding Information
- Israel Ministry of Innovation Science & Technology (6013)
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