The foundations of Shockley's equation for the average electron–hole-pair creation energy in semiconductors
Open Access
- 25 July 2022
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 121 (4)
Abstract
Energetic carriers in semiconductors thermalize by impact-ionization, which generates electron–hole pairs (EHPs), and by energy losses to phonons. The average EHP creation energy is typically about three times the energy gap. In 1960, Shockley derived a simple equation for the average EHP creation energy with a single free parameter that fits experimental values for a wide range of materials, but the underlying assumptions, as stated, have been widely criticized as lacking justification. Modified expressions derived by improved approximations have been proposed but do not fare better. Here, we revisit the foundations of Shockley's equation and provide a robust justification for the kinetic-energy component as a model averaging procedure and then apply a similar procedure to the phonon component of the equation. The phonon result retains Shockley's form, but the interpretation and justification are now on par with those of the kinetic-energy term. The single-parameter fit to the data remains unchanged, i.e., the present analysis accounts for the exceptional applicability of Shockley's equation.Keywords
Funding Information
- Air Force Office of Scientific Research
This publication has 11 references indexed in Scilit:
- Assessment of phonon scattering-related mobility in β -Ga 2 O 3Semiconductor Science and Technology, 2018
- Theory of inelastic multiphonon scattering and carrier capture by defects in semiconductors: Application to capture cross sectionsPhysical Review B, 2015
- Scattering by ionization and phonon emission in semiconductors. II. Monte Carlo calculationsPhysical Review B, 1983
- Scattering by ionization and phonon emission in semiconductorsPhysical Review B, 1980
- Electron-Hole-Pair Creation Energies in SemiconductorsPhysical Review Letters, 1975
- Bandgap Dependence and Related Features of Radiation Ionization Energies in SemiconductorsJournal of Applied Physics, 1968
- Impact ionization and quantum efficiency in semiconductorsCzechoslovak Journal of Physics, 1967
- The energy of electron-hole pair formation by X-rays in PbOJournal of Physics and Chemistry of Solids, 1961
- Problems related top-n junctions in siliconCzechoslovak Journal of Physics, 1961
- Problems related to p-n junctions in siliconSolid-State Electronics, 1961