Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement
Authors:
- Fabien SalzensteinFSFabien Salzenstein
- Denis MontanerDMDenis Montaner
- Abdel-Ouahab BoudraaAbdel-Ouahab Boudraa
Open Access
- 23 October 2005
- journal article
- research article
- Published by Springer Nature in EURASIP Journal on Advances in Signal Processing
- Vol. 2005 (17) , 731636-2815