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Stress Measurable Tensile Device for Electron Microscopic Observation
Home
Publications
Stress Measurable Tensile Device for Electron Microscopic Observation
Stress Measurable Tensile Device for Electron Microscopic Observation
Authors:
HS
Hiroyasu Saka
Hiroyasu Saka
TI
Toru Imura
Toru Imura
NY
Natsuo Yukawa
Natsuo Yukawa
II
Isemi Igarashi
Isemi Igarashi
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1 September 1968
journal article
other
Published by
Physical Society of Japan
in
Journal of the Physical Society of Japan
Vol. 25
(3)
,
906
DOI:
10.1143/jpsj.25.906
Abstract
No abstract available
Cited
Cited by 15 articles
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