Nitrogen gas (N2), by near-ambient pressure XPS

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Abstract
Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at ca. 2500 Pa, or even higher in some cases. With NAP-XPS, XPS can probe moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show NAP-XPS survey and narrow scans from nitrogen gas (N2), a material that could not be analyzed at moderate pressures by conventional approaches. Nitrogen gas is an important reference material for NAP-XPS because residual N2 from the air and/or venting produces an N 1s signal in many NAP-XPS spectra. Nitrogen gas may also be deliberately employed as the gaseous background for NAP-XPS experiments. The survey spectrum of N2 gas contains N 1s, N 2s, N KLL (Auger), and valence band signals. This submission is part of a series of articles on NAP-XPS that has been submitted to Surface Science Spectra.

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