Low-Temperature Grüneisen Parameters for Silicon and Aluminum

This publication has 25 references indexed in Scilit:

• Thermoelastic Response of Polycrystalline Metals to Relativistic Electron Beam Absorption
  Journal of Applied Physics, 1970
• Experimental Determination of the Low-Temperature Grüneisen Parameter of Silicon from Pressure Derivatives of Elastic Constants
  Physical Review B, 1970
• GRÜNEISEN DATA FROM THE ONE-DIMENSIONAL THERMOELASTIC RESPONSE OF ELASTIC MATERIALS
  Applied Physics Letters, 1970
• Electronic Dilation in Germanium and Silicon
  Physical Review B, 1969
• THE DYNAMIC RESPONSE OF SOLIDS EXPOSED TO A PULSED-ELECTRON-BEAM
  Applied Physics Letters, 1968
• Thermal Expansions from 2 to 40°K of Ge, Si, and Four III-V Compounds
  Physical Review B, 1967
• THERMOELASTIC STRESS PULSES RESULTING FROM PULSED ELECTRON BEAMS
  Applied Physics Letters, 1967
• Effects of Radiation on Semiconductors
  1965
• Problems related to p-n junctions in silicon
  Solid-State Electronics, 1961
• A new method for measuring the thermal expansion of solids at low temperatures; the thermal expansion of copper and aluminium and the Grüneisen rule
  Physica, 1954