Data-driven unsupervised anomaly detection of manufacturing processes with multi-scale prototype augmentation and multi-sensor data
Authors:
- Zongliang XieZXZongliang Xie
- Zhipeng ZhangZZZhipeng Zhang
- Jinglong ChenJCJinglong Chen
- Yong FengYFYong Feng
- Xingyu PanXPXingyu Pan
- Zitong ZhouZZZitong Zhou
- Shuilong HeSHShuilong He
- 7 September 2024
- journal article
- research article
- Published by Elsevier in Journal of Manufacturing Systems
- Vol. 77, 26-39
Abstract
No abstract availableKeywords
Funding Information
- National Natural Science Foundation of China
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