Nonlinear characteristics of Weibull breakdown distributions and its impact on reliability projection for ultra-thin oxides
Authors:
- E.Y. WuEWE.Y. Wu
- E. NowakENE. Nowak
- L.K. HanLHL.K. Han
- D. DufresneDDD. Dufresne
- W.W. AbadeerWAW.W. Abadeer
- 22 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 441-444
Abstract
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