Quantitative auger electron analysis of homogeneous binary alloys: Chromium in gold
Author:
- P.H. HollowayPHP.H. Holloway
- 1 September 1977
- journal article
- Published by Elsevier in Surface Science
- Vol. 66 (2) , 479-494
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
- Relative sensitivity factors for quantitative Auger analysis of binary alloysSurface Science, 1977
- The influence of glancing incidence excitation upon the Auger yield curve of goldSolid State Communications, 1976
- Ion sputtering of alloysJournal of Vacuum Science and Technology, 1976
- Electron attenuation lengths for free‐electron‐like metalsJournal of Vacuum Science and Technology, 1976
- Relative sputtering yields and quantitative surface analysis by Auger spectroscopyJournal of Vacuum Science and Technology, 1976
- Abstract: Cross sections for ionization of inner‐shell electrons by electron impactJournal of Vacuum Science and Technology, 1976
- Quantitative auger electron spectroscopy analysis of AgPd and NiPd alloysSurface Science, 1975
- Attenuation lengths of low-energy electrons in solidsSurface Science, 1974
- Techniques for elemental composition profiling in thin filmsC R C Critical Reviews in Solid State Sciences, 1973
- Reduced Sputtering Yields for Two-Phase Ag–Ni and Ag–Co TargetsJournal of Applied Physics, 1972